Security News > 2019 > October > New method validates the integrity of computer chips using x-rays

Guaranteeing that computer chips, that can consist of billions of interconnected transistors, are manufactured without defects is a challenge. But how to determine if a chip is compromised? Now a technique co-developed by researchers at the Paul Scherer Institut in Switzerland and researchers at the USC Viterbi School of Engineering would allow companies and other organizations to non-destructively scan chips to ensure that they haven’t been altered and that they are manufactured to design specifications … More → The post New method validates the integrity of computer chips using x-rays appeared first on Help Net Security.

News URL

http://feedproxy.google.com/~r/HelpNetSecurity/~3/jU1QOSZOIpk/