Vulnerabilities > Qualcomm > Wcn3620 Firmware

DATE CVE VULNERABILITY TITLE RISK
2025-03-03 CVE-2024-53014 Improper Validation of Array Index vulnerability in Qualcomm products
Memory corruption may occur while validating ports and channels in Audio driver.
local
low complexity
qualcomm CWE-129
7.8
2025-03-03 CVE-2024-53023 Use After Free vulnerability in Qualcomm products
Memory corruption may occur while accessing a variable during extended back to back tests.
local
low complexity
qualcomm CWE-416
7.8
2025-03-03 CVE-2024-53024 NULL Pointer Dereference vulnerability in Qualcomm products
Memory corruption in display driver while detaching a device.
local
low complexity
qualcomm CWE-476
7.8
2025-03-03 CVE-2024-53027 Classic Buffer Overflow vulnerability in Qualcomm products
Transient DOS may occur while processing the country IE.
network
low complexity
qualcomm CWE-120
7.5
2025-02-03 CVE-2024-38404 Out-of-bounds Read vulnerability in Qualcomm products
Transient DOS when registration accept OTA is received with incorrect ciphering key data IE in modem.
network
low complexity
qualcomm CWE-125
7.5
2025-02-03 CVE-2024-38417 Out-of-bounds Read vulnerability in Qualcomm products
Information disclosure while processing IO control commands.
local
low complexity
qualcomm CWE-125
5.5
2025-02-03 CVE-2024-38418 Time-of-check Time-of-use (TOCTOU) Race Condition vulnerability in Qualcomm products
Memory corruption while parsing the memory map info in IOCTL calls.
local
high complexity
qualcomm CWE-367
7.0
2025-02-03 CVE-2024-45560 Time-of-check Time-of-use (TOCTOU) Race Condition vulnerability in Qualcomm products
Memory corruption while taking a snapshot with hardware encoder due to unvalidated userspace buffer.
local
high complexity
qualcomm CWE-367
7.0
2025-02-03 CVE-2024-45561 Use After Free vulnerability in Qualcomm products
Memory corruption while handling IOCTL call from user-space to set latency level.
local
low complexity
qualcomm CWE-416
7.8
2025-02-03 CVE-2024-45573 Improper Restriction of Operations within the Bounds of a Memory Buffer vulnerability in Qualcomm products
Memory corruption may occour while generating test pattern due to negative indexing of display ID.
local
low complexity
qualcomm CWE-119
7.8