Vulnerabilities > Qualcomm > Snapdragon W5 GEN 1 Wearable Firmware > High

DATE CVE VULNERABILITY TITLE RISK
2024-09-02 CVE-2024-33050 Out-of-bounds Read vulnerability in Qualcomm products
Transient DOS while parsing MBSSID during new IE generation in beacon/probe frame when IE length check is either missing or improper.
network
low complexity
qualcomm CWE-125
7.5
2024-09-02 CVE-2024-33051 Out-of-bounds Read vulnerability in Qualcomm products
Transient DOS while processing TIM IE from beacon frame as there is no check for IE length.
network
low complexity
qualcomm CWE-125
7.5
2024-09-02 CVE-2024-33060 Use After Free vulnerability in Qualcomm products
Memory corruption when two threads try to map and unmap a single node simultaneously.
local
low complexity
qualcomm CWE-416
7.8
2024-09-02 CVE-2024-38401 Use After Free vulnerability in Qualcomm products
Memory corruption while processing concurrent IOCTL calls.
local
low complexity
qualcomm CWE-416
7.8
2024-09-02 CVE-2024-38402 Use After Free vulnerability in Qualcomm products
Memory corruption while processing IOCTL call for getting group info.
local
low complexity
qualcomm CWE-416
7.8