Vulnerabilities > Qualcomm > Snapdragon W5 GEN 1 Wearable Firmware
| DATE | CVE | VULNERABILITY TITLE | RISK |
|---|---|---|---|
| 2025-03-03 | CVE-2024-43057 | Use After Free vulnerability in Qualcomm products Memory corruption while processing command in Glink linux. | 7.8 |
| 2025-03-03 | CVE-2024-53014 | Improper Validation of Array Index vulnerability in Qualcomm products Memory corruption may occur while validating ports and channels in Audio driver. | 7.8 |
| 2025-03-03 | CVE-2024-53023 | Use After Free vulnerability in Qualcomm products Memory corruption may occur while accessing a variable during extended back to back tests. | 7.8 |
| 2025-03-03 | CVE-2024-53024 | NULL Pointer Dereference vulnerability in Qualcomm products Memory corruption in display driver while detaching a device. | 7.8 |
| 2025-03-03 | CVE-2024-53027 | Classic Buffer Overflow vulnerability in Qualcomm products Transient DOS may occur while processing the country IE. | 7.5 |
| 2025-03-03 | CVE-2025-21424 | Use After Free vulnerability in Qualcomm products Memory corruption while calling the NPU driver APIs concurrently. | 7.8 |
| 2025-02-03 | CVE-2024-38414 | Out-of-bounds Read vulnerability in Qualcomm products Information disclosure while processing information on firmware image during core initialization. | 5.5 |
| 2025-02-03 | CVE-2024-38418 | Time-of-check Time-of-use (TOCTOU) Race Condition vulnerability in Qualcomm products Memory corruption while parsing the memory map info in IOCTL calls. | 7.0 |
| 2025-02-03 | CVE-2024-45584 | Improper Restriction of Operations within the Bounds of a Memory Buffer vulnerability in Qualcomm products Memory corruption can occur when a compat IOCTL call is followed by a normal IOCTL call from userspace. | 7.8 |
| 2025-02-03 | CVE-2024-49834 | Improper Validation of Array Index vulnerability in Qualcomm products Memory corruption while power-up or power-down sequence of the camera sensor. | 7.8 |