Vulnerabilities > Qualcomm > Snapdragon 8 GEN 1 Mobile Firmware > High

DATE CVE VULNERABILITY TITLE RISK
2025-02-03 CVE-2024-38418 Time-of-check Time-of-use (TOCTOU) Race Condition vulnerability in Qualcomm products
Memory corruption while parsing the memory map info in IOCTL calls.
local
high complexity
qualcomm CWE-367
7.0
2025-02-03 CVE-2024-38420 Out-of-bounds Write vulnerability in Qualcomm products
Memory corruption while configuring a Hypervisor based input virtual device.
local
low complexity
qualcomm CWE-787
7.8
2025-02-03 CVE-2024-45582 Improper Validation of Array Index vulnerability in Qualcomm products
Memory corruption while validating number of devices in Camera kernel .
local
low complexity
qualcomm CWE-129
7.8
2025-02-03 CVE-2024-49832 Improper Validation of Array Index vulnerability in Qualcomm products
Memory corruption in Camera due to unusually high number of nodes passed to AXI port.
local
low complexity
qualcomm CWE-129
7.8
2025-02-03 CVE-2024-49833 Improper Validation of Array Index vulnerability in Qualcomm products
Memory corruption can occur in the camera when an invalid CID is used.
local
low complexity
qualcomm CWE-129
7.8
2025-02-03 CVE-2024-49834 Improper Validation of Array Index vulnerability in Qualcomm products
Memory corruption while power-up or power-down sequence of the camera sensor.
local
low complexity
qualcomm CWE-129
7.8
2025-02-03 CVE-2024-49838 Out-of-bounds Read vulnerability in Qualcomm products
Information disclosure while parsing the OCI IE with invalid length.
network
low complexity
qualcomm CWE-125
7.5
2025-01-06 CVE-2024-21464 Classic Buffer Overflow vulnerability in Qualcomm products
Memory corruption while processing IPA statistics, when there are no active clients registered.
local
low complexity
qualcomm CWE-120
7.8
2025-01-06 CVE-2024-45553 Use After Free vulnerability in Qualcomm products
Memory corruption can occur when process-specific maps are added to the global list.
local
low complexity
qualcomm CWE-416
7.8
2024-10-07 CVE-2024-43047 Use After Free vulnerability in Qualcomm products
Memory corruption while maintaining memory maps of HLOS memory.
local
low complexity
qualcomm CWE-416
7.8