Vulnerabilities > Qualcomm > Sm4375 Firmware > High

DATE CVE VULNERABILITY TITLE RISK
2022-11-15 CVE-2022-25724 Classic Buffer Overflow vulnerability in Qualcomm products
Memory corruption in graphics due to buffer overflow while validating the user address in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Voice & Music, Snapdragon Wearables
local
low complexity
qualcomm CWE-120
7.8
2022-11-15 CVE-2022-25743 Use After Free vulnerability in Qualcomm products
Memory corruption in graphics due to use-after-free while importing graphics buffer in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Voice & Music, Snapdragon Wearables
local
low complexity
qualcomm CWE-416
7.8
2022-11-15 CVE-2022-33237 Out-of-bounds Read vulnerability in Qualcomm products
Transient DOS due to buffer over-read in WLAN firmware while processing PPE threshold.
network
low complexity
qualcomm CWE-125
7.5
2022-11-15 CVE-2022-33239 Infinite Loop vulnerability in Qualcomm products
Transient DOS due to loop with unreachable exit condition in WLAN firmware while parsing IPV6 extension header.
network
low complexity
qualcomm CWE-835
7.5
2022-10-19 CVE-2022-25736 Out-of-bounds Read vulnerability in Qualcomm products
Denial of service in WLAN due to out-of-bound read happens while processing VHT action frame in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Consumer Electronics Connectivity, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Voice & Music, Snapdragon Wearables, Snapdragon Wired Infrastructure and Networking
network
low complexity
qualcomm CWE-125
7.5
2022-10-19 CVE-2022-25749 Out-of-bounds Read vulnerability in Qualcomm products
Transient Denial-of-Service in WLAN due to buffer over-read while parsing MDNS frames.
network
low complexity
qualcomm CWE-125
7.5
2022-10-19 CVE-2022-33214 Time-of-check Time-of-use (TOCTOU) Race Condition vulnerability in Qualcomm products
Memory corruption in display due to time-of-check time-of-use of metadata reserved size in Snapdragon Auto, Snapdragon Compute, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables
local
high complexity
qualcomm CWE-367
7.0