Vulnerabilities > Qualcomm > Qcm6490 Firmware
DATE | CVE | VULNERABILITY TITLE | RISK |
---|---|---|---|
2025-02-03 | CVE-2024-45573 | Improper Restriction of Operations within the Bounds of a Memory Buffer vulnerability in Qualcomm products Memory corruption may occour while generating test pattern due to negative indexing of display ID. | 7.8 |
2025-02-03 | CVE-2024-49834 | Improper Validation of Array Index vulnerability in Qualcomm products Memory corruption while power-up or power-down sequence of the camera sensor. | 7.8 |
2025-02-03 | CVE-2024-49838 | Out-of-bounds Read vulnerability in Qualcomm products Information disclosure while parsing the OCI IE with invalid length. | 7.5 |
2025-02-03 | CVE-2024-49839 | Out-of-bounds Read vulnerability in Qualcomm products Memory corruption during management frame processing due to mismatch in T2LM info element. | 9.8 |
2025-01-06 | CVE-2024-45541 | Classic Buffer Overflow vulnerability in Qualcomm products Memory corruption when IOCTL call is invoked from user-space to read board data. | 7.8 |
2025-01-06 | CVE-2024-45542 | Out-of-bounds Write vulnerability in Qualcomm products Memory corruption when IOCTL call is invoked from user-space to write board data to WLAN driver. | 7.8 |
2025-01-06 | CVE-2024-45558 | Out-of-bounds Read vulnerability in Qualcomm products Transient DOS can occur when the driver parses the per STA profile IE and tries to access the EXTN element ID without checking the IE length. | 7.5 |
2024-12-02 | CVE-2024-33044 | Improper Validation of Array Index vulnerability in Qualcomm products Memory corruption while Configuring the SMR/S2CR register in Bypass mode. | 7.8 |
2024-12-02 | CVE-2024-43050 | Out-of-bounds Write vulnerability in Qualcomm products Memory corruption while invoking IOCTL calls from user space to issue factory test command inside WLAN driver. | 7.8 |
2024-11-04 | CVE-2024-38405 | Out-of-bounds Read vulnerability in Qualcomm products Transient DOS while processing the CU information from RNR IE. | 6.5 |